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fabrication | featured | news

New Die Matrix Expander Available

Improve your dicing post-processing with our new die matrix expander

October 30, 2024
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Diced silicon wafer on a die matrix expander tool
featured | news

Advanced XRD techniques and applications on Bruker D8D plus diffractometer

Non-Coplanar Scan, Pole Figure, 2D Stress Measurement, and Multi-Angle Scattering

October 1, 2024
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fabrication | featured | news

In-situ heating S/TEM is available

The in-situ heating TEM analysis is now available to all users.

Xuehai Tan
August 22, 2023
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fabrication | featured | news

Broad Ion Beam (BIB) polishing for SEM/EDX/EBSD

Automatic, unattended process for large area preparation.

Peng Li
June 3, 2023
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An image of a machine with an arrow pointing to it, emphasizing its characterization.
fabrication | featured | news

nGauge AFM is now Available at nanoFAB

AFM by 3 easy steps: Sweep, Approach, and Scan.

Nastaran Yousefi
May 22, 2022
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A pink disc is being placed on top of a lithography machine.
news

Raith_GDSII toolbox documentation now on Read The Docs

See the new online documentation for the Raith_GDSII MATLAB toolbox

Aaron Hryciw
July 31, 2023
fabrication | featured | news

Broad Ion Beam (BIB) polishing for SEM/EDX/EBSD

Automatic, unattended process for large area preparation.

Peng Li
June 3, 2023
fabrication | featured | news

nGauge AFM is now Available at nanoFAB

AFM by 3 easy steps: Sweep, Approach, and Scan.

Nastaran Yousefi
May 22, 2023
fabrication | featured | news

In-situ heating S/TEM is available

The in-situ heating TEM analysis is now available to all users.

Xuehai Tan
March 20, 2023
fabrication | news

Bruker D8D plus XRD-SAXS is Operational

Heating & Biasing; Imaging, Diffraction and EDX

Xuehai Tan
March 5, 2023
news

New nanoFAB Characterization Staff

Meet the newest member of the nanoFAB Characterization Group

Peng Li
February 28, 2023
fabrication | news

Auto Slice & View (ASV) fully commissioned

Fully automatic FIB/SEM tomography

Peng Li
January 10, 2023
characterization | news

New nanoFAB Characterization Staff

Meet the newest member of the nanoFAB Characterization Group

Peng Li
December 3, 2022
characterization | fabrication | news

XPS analysis of air-sensitive materials

The nanoFAB is pleased to announce that analysis of air-sensitive materials is available on the PHI VP3 XPS system. Proper sample handling is critical to analyze materials that are sensitive to air. We have been working to bring the capabilities of analyzing air-sensitive materials on to our analytical instruments. A controlled-environment transfer vessel is now commissioned […]

Peng Li
November 10, 2022
characterization | fabrication | news

Spin Mill with Plasma FIB

Large-area planar sample preparation

Peng Li
August 21, 2022
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