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Advanced Lithography
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Contact photolithography
- General-purpose UV exposures
- H-line (405 nm) / I-line (365 nm)
- IR/optical backside alignment
- Deep-UV exposures (220 nm / 254 nm)
- Semi-automated alignment
- Positive/negative tone resist chemistries
In-house photomask fabrication
- Produces 5" & 7" photomasks
- 1 µm minimum feature size
- Full-service processing with online mask submission
Focused ion beam milling
- Zeiss ORION helium ion microscope with gallium FIB
- He beam for milling delicate sub-10 nm nanostructures (nanomachining)
- Ga FIB for bulk micromachining
- Patterning and imaging controlled using Fibics NPVE system