In-situ heating S/TEM is available
The nanoFAB is pleased to announce that the DENS solutions In-Situ Lightning TEM holder is fully commissioned and in-situ heating TEM analysis is available on the JEOL JEM-ARM200CF S/TEM Microscope.
The DENS lightning in-situ heating platform utilizes the state-of-the-art MEMS technology to create the lab-on-chip environment that replicates the real-life heating conditions inside the TEM, which provides unprecedented control and accuracy over temperature:
- 8 contacts for simultaneous heating and biasing analysis
- Double tilted holder
- Maximum heating temperature of 1100 °C
- Flexible and customizable heating profiles
- Compatible with EDX analysis
All these unique features enable dynamic analysis of morphological (imaging), structural (diffraction) and compositional (EDX) changes of materials at very high spatial resolution on the JEOL ARM S/TEM.
The in-situ heating TEM analysis is now available to all users. If you have needs for these analysis, please submit a sample analysis request with sample details on LMACS. If you have any questions, please feel free to contact Dr. Xuehai Tan (xtan@ualberta.ca) – the primary TEM staff member or Peng Li (Peng.Li@ualberta.ca) – the Characterization Group Manager.
Application Examples
